Wafer Geometry Verification System NGR3520
”The Die to Database algorithm” that compares design data with SEM images solves systematic problems quickly on the leading-edge semiconductor device manufacturing.
- Tuesday September 10th, 2019 News NGR Inc. exhibits at “SEMICON TAIWAN 2019
- Wednesday August 7th, 2019 News Summer Business Announcements
- Friday June 21st, 2019 Papers Edge placement error measurement in lithography process with die to database algorithm
- Friday June 21st, 2019 Papers E-beam inspection of single exposure EUV direct print of M2 layer of N10 node test vehicle
- Tuesday March 5th, 2019 News NGR Inc. exhibits at “SEMICON CHINA 2019”