Wafer Geometry Verification System NGR3520
”The Die to Database algorithm” that compares design data with SEM images solves systematic problems quickly on the leading-edge semiconductor device manufacturing.
Monday January 15th, 2018
NEW !NGR Inc. exhibits at “SEMICOM KOREA 2018”
- Tuesday December 12th, 2017 News NGR Inc. exhibits at “SEMICON JAPAN 2017”
- Wednesday July 26th, 2017 News Relocation of our head office
- Monday June 5th, 2017 News Announcement of Acquisition by Toray Engineering Co., Ltd.
- Tuesday October 25th, 2016 News NGR Inc. contributes to A-SSCC as a supporter company