Wafer Geometry Verification System NGR3520
”The Die to Database algorithm” that compares design data with SEM images solves systematic problems quickly on the leading-edge semiconductor device manufacturing.
Wednesday July 26th, 2017
NEW !Relocation of our head office
Monday June 5th, 2017
NEW !Announcement of Acquisition by Toray Engineering Co., Ltd.
- Tuesday October 25th, 2016 News NGR Inc. contributes to A-SSCC as a supporter company
- Monday August 1st, 2016 News Our website has been redesigned
- Thursday March 31st, 2016 News About publication of a paper related to NGR products at the SPIE conference