Wafer Geometry Verification System NGR3520
”The Die to Database algorithm” that compares design data with SEM images solves systematic problems quickly on the leading-edge semiconductor device manufacturing.
- Tuesday March 5th, 2019 News NGR Inc. exhibits at “SEMICON CHINA 2019”
- Thursday February 21st, 2019 News “NGR Inc. at SPIE Advanced Lithography 2019”
- Wednesday January 9th, 2019 News NGR Inc. exhibits at “SEMICON KOREA 2019”
- Monday January 7th, 2019 News HAPPY NEW YEAR!
- Wednesday December 26th, 2018 News Our New Year’s holiday