NGR Inc. was founded in July, 2000 to create an OPC verification system based on the “Die to Database algorithm”.
The NGR semiconductor wafer pattern verification system, which is the collectiveness of advanced technology with the use of electron microscope as hardware, has produced various applications not only for OPC verification, but also for other uses including nanodefect inspection, mass CD measurement, and in-chip overlay measurement. This system has occupied an important place in the field of leading-edge semiconductor inspection and metrology.
Today, semiconductor devices continued to become more advanced as we also are seeing transition in semiconductor structures as seen with 3D memory and FinFET. These advancements in semiconductor devices are resulting in more advance parameters for inspection and metrology systems.
NGR Inc. became a member company of Toray group on June 1, 2017. To meet the advanced demands for inspection and metrology system used in next-generation semiconductor devices, NGR works to develop systems for use in next-generation semiconductor devices with excellent development skills and reliable manufacturing resources as a Toray group. We will continue our pursuit of creating systems that support the progress of semiconductor device manufactures.
President & CEO